dcme
is under development and not yet available on CRAN. You can install the development version using the remotes
package as follows:
The following complexity measures are currently implemented:
num_examples
: Number of Observationsnum_features
: Number of Featuresnum_features_numeric
: Number of Numeric Featuresnum_features_binary
: Number of Binary Featuresnum_features_categorical
: Number of Categorical Featuresnum_classes
: Number of Classesproportion_features_numeric
: Proportion of Numeric Featuresproportion_features_binary
: Proportion of Binary Featuresproportion_features_categorical
: Proportion of Categorical Featuressd_ratio
: Geometric Mean Ratio of Standard Deviationscorr_abs
: Mean Absolute Correlation Coefficientnum_examples_majority
: Number of Observations in the Majority Classnum_examples_minority
: Number of Observations in the Minority Classproportion_examples_majority
: Proportion of Majority Examplesproportion_examples_minority
: Proportion of Minority ExamplesIR
: Imbalance Ratio (binary)C1
: Entropy of Class ProportionsC2
: Imbalance Ratio (multiclass)num_examples_majority
, num_examples_minority
, proportion_examples_majority
, proportion_examples_minority
, and IR
are defined only for binary data sets.
F1
: Fisher’s Discriminant RatioF2
: Volume of Overlap RegionF3
: Maximum Individual Feature EfficiencyUnfortunately these measures are implemented only for binary data sets.
Not implemented yet: F4 (Collective Feature Efficiency)
N2
: Ratio of Average Intra/Inter Class 1-NN DistanceN3
: Error Rate of 1-NN ClassifierNot implemented yet: N1 (Fraction of Borderline Points)
N4
: Nonlinearity of the 1-NN ClassifierNot implemented yet: T1 (Fraction of Hyperspheres Covering Data)
Definitions and explanations of most functions implemented in the dcme
package can be found in the following literature:
[1] Michie, D., Spiegelhalter, D. J., & Taylor, C. C. (1994). Machine learning, neural and statistical classification.
[2] Ho, T. K., & Basu, M. (2002). Complexity measures of supervised classification problems. IEEE transactions on pattern analysis and machine intelligence, 24(3), 289-300.